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| Issue 1298-4 |
| US 6,949,946 B1 |
| Integrated semiconductor circuit and method for functional testing of pad cells |
| Wilfried Dähn, Celle (Germany) |
| Assigned to Infineon Technologies AG, Munich (Germany) |
| Filed on Jan. 18, 2000, as Appl. No. 9/484,781. |
| Claims priority of application No. 199 01 460 (DE), filed on Jan. 15, 1999. |
| Int. Cl.7H03K 19/00 |
| U.S. Cl. 326—16 [326/83; 326/57] | 8 Claims |
| 1. An integrated semiconductor circuit, comprising:
a plurality of pad cells to be monitored in one operating mode by a functional test, said plurality of pad cells each having
a connecting pad, an upstream output driver, and a connection for an input signal;
a signal transmitter for producing periodic signal sequences, said signal transmitter having a connection for a periodic output
signal connected to said connections for an input signal of said plurality of pad cells to be tested, in order to test a transmission
response of said plurality of pad cells in said one operating mode; and
shift register cells each connected in series between said connection for an input signal of a respective one of said plurality
of pad cells and said connection of said signal transmitter for an output signal;
said connections for an input signal of said plurality of pad cells being connected in parallel to said connection of said
signal transmitter for an output signal.
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